CE Certified 4 Point Probe Head by JXL for Accurate Precision Measurements

The 4 point probe head from Chengdu JuXinLi Technology Co., Ltd. is engineered for precision in electrical measurements across various materials and thin films. This tool is optimized for four-point resistance measurements, making it essential for semiconductor testing, microelectronics research, and thin film characterization. Featuring high-quality tungsten probes, it ensures low contact resistance and protects sensitive samples from damage. Its compact and robust design allows for seamless integration into existing measurement systems, making it a versatile solution for diverse testing requirements. With adjustable probe spacing and customizable tip configurations, this probe head can accommodate various sample sizes and materials, providing accurate and repeatable results in laboratory research or manufacturing quality control.